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Techniques
| Analysis Techniques / Specimen Prep. |
abbr. |
|---|---|
| Adsorption isotherm | |
| Analytical Electron Microscope |
AEM |
| Ar Ion Etching | AIE |
| Atmospheric Pressure ChemicalIonization |
APCI |
| Atomic Absorption Spectrometry |
AAS |
| Atomic Force Microscope | AFM |
| Atomic Force Microscope - Infrared Spectrometry / Nano - Infrared Spectrometry |
AFM-IR / Nano-IR |
| Attenuated Total Reflection | ATR |
| Auger Electron Spectroscopy | AES |
| Backside SIMS | |
| Backside XPS | |
| BET(Brunauer, Emmet and Teller) |
BET |
| Capillary Electrophoresis | CE |
| Cathodoluminescence | CL |
| Chemical Ionization | CI |
| Composition Analysis | CA |
| Computed Tomography | CT |
| Confocal Laser Scanning Microscopy |
CLSM |
| Confocal laser scanning microscopy |
LSM |
| Crosssection Polisher / Broad Ion Beam |
CP / BIB |
| Density measurement | |
| Differential Scanning Calorimetry |
DSC |
| Diffuse Reflectence Infrared Fourier Transform |
DRIFT |
| Diffusion Ordered Spectroscopy |
DOSY |
| Distortion-less Enhancementby Polarization Transfer |
DEPT |
| Double Quantum Filter Correlation Spectroscopy |
DQF-COSY |
| Dynamic viscoelastic measurement |
|
| Electric Force Microscope | EFM |
| Electron Back Scatter Diffraction patterns |
EBSD |
| Electron Beam Induced Current | EBIC |
| Electron Energy Loss Spectroscopy |
EELS |
| Electron Ionization | EI |
| Electron Probe Micro Analysis | EPMA |
| Electron Spin Resonance | ESR |
| Electrospray Ionization | ESI |
| Electrothermal Vaporization-lnductively Coupled Plasma-Mass Spectrometry |
ETV-ICP-MS |
| Elemental Analysis | EA |
| Enzyme-Linked Immunosorbent Assay |
ELISA |
| Energy Dispersive X-ray Fluorescence |
EDX |
| Environmental analysis | |
| Evolved Gas Analysis | EGA |
| Extended X-ray Absorption Fine Structure |
EXAFS |
| Fast Atom Bombardment Mass Spectrometry |
FABMS |
| Field Desorption Mass Spectrometry |
FDMS |
| Field Emission-Scanning Electron Microscopy |
FE-SEM |
| Focused Ion Beam | FIB |
| Focused Ion Beam - Scanning Electron Microscopy |
FIB-SEM |
| Focused Ion Beam - Transmission Electron Microscopy |
FIB-TEM |
| Fourier Transform Infrared Spectroscopy |
FT-IR |
| Gas Chromatogfaphy - Flame Ionization Detector |
GC-FID |
| Gas Chromatography | GC |
| Gas Chromatography - Flame Photometric Detector |
GC-FPD |
| Gas Chromatography - Thermal Conductivity Detector |
GC-TCD |
| Gas Chromatography / Mass Spectrometry |
GC/MS |
| Gas permeability | |
| Gel Permeation Chromatography | GPC |
| Gel Permeation Chromatography - Dynamic Light Scattering |
GPC-DLS |
| Gel Permeation Chromatography - Laser Light Scattering |
GPC-LS |
| Gel Permeation Chromatography - Multi Angle Laser Light Scattering |
GPC-MALS |
| Gel Permeation Chromatography - Viscometry |
GPC-VISCO |
| Glow Discharge Mass Spectrometry |
GDMS |
| Glow Discharge Optical Emission Spectroscopy |
GD-OES |
| Grazing Incidence X-ray Reflectivity |
GIXR |
| Heteronuclear Multiple Bond Coherence |
HMBC |
| Heteronuclear Multiple Quantum Coherence |
HMQC |
| Hg Probe | Hg Probe |
| High Angle Annular Dark Field | HAADF |
| High Performance Liquid Chromatography |
HPLC |
| High Resolution Analytial Electron Microscope |
HRAEM |
| High Resolution Transmission Electron Microscope |
HRTEM |
| High Resolution-Rutherford Backscattering Spectrometry |
HR-RBS |
| Hydrogen Forward Scattering Spectrometry |
HFS |
| Infrared Spectroscopy | IR |
| Ion implantation | |
| Isothermal Titration Calorimetry | ITC |
| Kelvin probe Force Microscope | KFM |
| Laser Ablation - lnductively Coupled Plasma - Mass Spectrometry |
LA-ICP-MS |
| Liquid Chromatography / MassSpectrometry |
LC/MS |
| Liquid Chromatography / NuclearMagnetic Resonance |
LC/NMR |
| Liquid Chromatography / Tandem Mass Spectrometry |
LC/MS/MS |
| Inductively Coupled Plasma - Optical Emission Spectrometry |
ICP-OES |
| lnductively Coupled Plasma - Mass Spectrometry |
ICP-MS |
| lon Chromatography | IC |
| lon Chromatography - Mass Spectrometry |
IC-MS |
| lon Milling | IM |
| Magnetic Force Microscope | MFM |
| Mass Spectrometry | MS |
| Material test | |
| Matrix Assisted Laser Desorption / Ionization - Time of Flight Mass Spectrometry |
MALDI-TOFMS |
| Matrix Assisted Laser Desorption/Ionization-Mass Spectrometry |
MALDI-MS |
| Mechanical Properties | |
| Micro Focus X-ray Inspection System |
XCT |
| Micro Fourier Transform Infrared Spectroscopy (FTIR) |
micro FT-IR |
| Micro Raman Spectroscopy | micro Raman |
| Mössbauer spectroscopy / Moessbauer Spectroscopy |
|
| Nano Beam Diffraction | NBD |
| Nano Indentation | |
| NanoSIMS （ SIMS：Secondary Ion Mass Spectrometry） |
NanoSIMS |
| nano-ThermalAnalysis, micro-ThermalAnalysis |
nano-TA, μ-TA |
| Nuclear Magnetic Resonance | NMR |
| Nuclear Magnetic Resonance | NMR-S |
| Nuclear Reaction Analysis | NRA |
| Optical Microscope | OM |
| Particle counter, Particle size, Particle size distribution |
|
| ParticleInduced X-ray Emission | PIXE |
| pH measurement | pH |
| Photoacoustic Spectroscopy | PAS |
| Photoluminescence | PL |
| Plan View TEM | |
| Polymer Flow Scheme Tests | |
| Pore Size Distribution | PSD |
| Positron Annihilation Lifetime Spectroscopy |
PALS |
| Raman Spectroscopy | Raman |
| Refelection Absorption Spectroscopy |
RAS |
| Reflection Electron Energy Loss Spectroscopy |
REELS |
| Refractive index measurement | |
| Rheological Properties | |
| Riedveld Method | Riedveld Method |
| Rutherford Backscattering Spectrometry |
RBS |
| Scanning Capacitance Microscope |
SCM |
| Scanning Electron Microscope | SEM |
| Scanning Ion Microscope | SIM |
| Scanning Probe Microscope | SPM |
| Scanning Spreading Resistance Microscope |
SSRM |
| Scanning Transmission Electron Microscope |
STEM |
| Secondary Ion Mass Spectrometry |
SIMS |
| Specific surface measurement | |
| Spherical aberration corrected Scanning Transmission Electron Microscope |
Cs-corrected STEM |
| Surface Potential Microscope | SPoM |
| Saturation Transfer Difference -Nuclear Magnetic Resonance |
STD-NMR |
| surface tensiometry, interfacial tensiometry, contact angle measurement |
|
| Temperature Programmed Desorption - Mass Spectrometry |
TPD-MS |
| Thermal Analysis | TA |
| Thermal conductivity | |
| Thermal conductivity (3-omega Method) |
|
| Thermal conductivity (Thermoreflectance Method) |
|
| Thermal Desorption Spectroscopy |
TDS |
| Thermal diffusivity ・ Thermal conductivity |
|
| Thermo - mechanical Analysis |
TMA |
| Thermogravimetry | TG |
| Thermogravimetry - Differential Thermal Analysis |
TG-DTA |
| Thermogravimetry - Mass Spectrometry |
TG-MS |
| Time of Flight - Secondary Ion Mass Spectrometry |
TOF-SIMS |
| Total Organic Carbon | TOC |
| Transmission Electron Microscope |
TEM |
| Tunneling atomic force microscope |
TUNA |
| two-dimensional Fast Fourier Transform Analysis |
2-D FFT |
| Ultraviolet Photoelectron Spectroscopy |
UPS |
| Ultraviolet-Visible Absorption Spectroscopy |
UV-VIS |
| Vapor pressure measurement |
|
| Wavelength Dispersive X-ray Fluorescence |
WDX |
| Weak-Beam method | Weak-Beam |
| X-ray Absorption Fine Structure |
XAFS |
| X-ray Absorption Near Edge Structure |
XANES |
| X-ray diffraction | XRD |
| X-ray Fluorescence | XRF |
| X-Ray Microscope | XRM |
| X-ray Photoelectron S pectroscopy |
XPS |
| X-ray Reflectivity Analysis |
XRR |
| X-ray Scanning Analytical Microscope |
XSAM |
| Zeta potential measurement |