Toray Research Center, IncToray Research Center, Inc

"Contributing to society with advanced technology"
Providing through analytical techniques and physical property evaluation.

Toray Research Center was established in June 1978 from R&D division of Toray lndustries, Inc. We have been engaged in providing technical support for "cause analysis" and "problem solving" in the fields of research, development and manufacturing, using innovative analytical techniques and physical analyses. We always try to possess cutting edge analytical techniques and brand new analytical methods.

We support customers' better manufacturing by analytical technology.
Using not only high analytical skills but also appropriate methods and equipment
Our strength is the ability to propose solutions to solve problems.

Technical Lineup

Introduction Movie

Technical Documents

NanoSIMS 50L
NanoSIMS 50L is a high sensitive mass imaging analyzer, which is available for the impurity detection at the ppm level and at the spatial resolution of 50 nm. NanoSIMS 50L is applicable to the various fields, including the semiconductor and display devices. Using the labeling technique we uniquely developed, we can measure the two dimensional bonding structure of biological specimen.

Technical Documents

AFM-Raman spectroscopy is the latest analytical technique that combines AFM observation and Raman imaging with the nanometer level resolution. The newly developed next-generation AFM-Raman probe enables to perform the highly stable measurement and nanoscale structural analysis for the carbon materials such as carbon nanotubes and graphene.

Our new RBS system has drastically improved elemental composition analysis, in terms of micro analysis, high mass resolution, and high sensitivity for light elements. High quality focused ion beam of min. 1 micron diameter enables accurate compositional depth profiling on a real device. Furthermore, since the instrument can accelerate various kinds of incident ions with wide range of acceleration voltage, sensitivity of light elements (Li, B, C, N, O, P etc.), and mass resolution of heavy elements have been remarkably improved. By using channeling measurement mode, crystallinity and ratio of substitutional / interstitial atoms can be evaluated. Our new RBS system opens up the possibility of new analytical method in various fields, and gives you new insight for your challenge.

Features of μRBS

  • Accurate composition/density analysis in a microscopic region by using focused ion beam
  • Quantification of all elements by using high mass resolution mode
  • High sensitive detection of light elements (H, Li, B etc.)


We introduced the latest femtosecond laser ablation (fsLA) device equipped with galvanometric optics which enables quick multiple irradiations.
By connecting fsLA to ICP-MS, quantitative analysis of the trace elements in solid sample is available without dissolving sample.
It can also be applied to hard-to-digest materials such as silicon carbide.
In addition, the signal stability and sensitivity of elemental imaging can be significantly improved compared to conventional LA-ICP-MS.

Introduction Movie

Technical Documents

ACOM-TEM (Automated Crystal Orientation Mapping in TEM) is one of powerful techniques for the crystallographic characterization with nanometer spatial resolution. Crystal orientation and grain size can be evaluated quantitatively. This technique is based on TEM so that conventional observation and EDX/EELS measurements are also available in the same experimental system.

Optical Photothermal IR Spectroscopy (O-PTIR) enables the infrared measurement with a high spatial resolution of less than 1 μm to be impossible by use of conventional FT-IR. It can be applied to analyse the composition of small foreign substances, and the interface composition of multi-layered samples at the same time and with a spatial resolution of less than 1 μm. By combining Raman instrument, O-PTIR realizes the high quality analysis of inorganic and organic materials.

Technical Documents

High-performance Surface Plasmon Resonance instrument (SPR)
We introduced the latest SPR instrument, Sierra SPR-24.

<1>High-performance surface plasmon resonance instrument (SPR)

The high-performance surface plasmon resonance instrument (SPR) allows label-free, real-time detection of intermolecular interaction and provides kinetics information, such as binding affinity or binding/dissociation kinetics. SPR is useful for interaction analysis of a wide range of molecules including small molecules, peptides, nucleic acids, and proteins.

<2>Features of high-performance surface plasmon resonance instrument (SPR)


  • Equipped with 8 channels having 3 sensor spots, and 24 sensor spots in total are available with a sensor chip. Ligand immobilization and analyte injection can be conducted individually per spot. Up to 24 different ligands can be screened at once.
  • Since the 24 sensor spots can be used completely individually, comparison of analysis conditions is easily conducted.


  • Enables robust measurement of interaction with small molecule as fragments, compounds, and others.
  • Baseline noise<0.02 RU(RMS)

<3>Analysis example utilized numerous sensor spots

SICK(Single Injection Cycle Kinetics) method
This method realizes a speedy kinetics analysis by injecting analyte solutions of different concentrations to numerous sensor spots where the same ligands are immobilized.


  • Screening and kinetics analysis of small molecules for target proteins
  • Screening and characterization of biopharmaceuticals
  • Various intermolecular interaction analyses of compounds, peptides, nucleic acids, proteins, and sugars
  • Comprehensive intermolecular interaction analysis combined with other methods, such as ITC, NMR, MS, CD, and high-speed AMF

Technical Documents

The TPD-TOFMS method was established by combining a temperature-controllable furnace with a high-resolution Time-Of-Flight Mass Spectrometer (TOFMS).
The TPD-TOFMS method makes it possible to separate and qualify the same integer mass compounds (CO and N2, SO2 and S2, etc.), which was previously difficult, and enables more detailed analysis of the evolved gases during heating.

Technical Documents

GCIB-TOF-SIMS, TOF-SIMS depth profiling with gas cluster ion beam (GCIB), enables depth profiling of organics with low damage.
We can provide the information of composition and depth distribution of organics, and interface of multilayer for the purpose of degradation analysis, process evaluation, etc.
This technique is applicable to various fields of organic samples, such as OLED, polymer, photoresist, SEI on battery electrode.