Toray Research Center, IncToray Research Center, Inc

"Contributing to society with advanced technology"
Providing through analytical techniques and physical property evaluation.

Toray Research Center was established in June 1978 from R&D division of Toray lndustries, Inc. We have been engaged in providing technical support for "cause analysis" and "problem solving" in the fields of research, development and manufacturing, using innovative analytical techniques and physical analyses. We always try to possess cutting edge analytical techniques and brand new analytical methods.

We support customers' better manufacturing by analytical technology.
Using not only high analytical skills but also appropriate methods and equipment
Our strength is the ability to propose solutions to solve problems.

Technical Lineup

Introduction Movie

NanoSIMS 50L
NanoSIMS 50L is a high sensitive mass imaging analyzer, which is available for the impurity detection at the ppm level and at the spatial resolution of 50 nm. NanoSIMS 50L is applicable to the various fields, including the semiconductor and display devices. Using the labeling technique we uniquely developed, we can measure the two dimensional bonding structure of biological specimen.

Technical Data

AFM-Raman
AFM-Raman spectroscopy is the latest analytical technique that combines AFM observation and Raman imaging with the nanometer level resolution. The newly developed next-generation AFM-Raman probe enables to perform the highly stable measurement and nanoscale structural analysis for the carbon materials such as carbon nanotubes and graphene.

Technical Data

μRBS
Our new RBS system has drastically improved elemental composition analysis, in terms of micro analysis, high mass resolution, and high sensitivity for light elements. High quality focused ion beam of min. 1 micron diameter enables accurate compositional depth profiling on a real device. Furthermore, since the instrument can accelerate various kinds of incident ions with wide range of acceleration voltage, sensitivity of light elements (Li, B, C, N, O, P etc.), and mass resolution of heavy elements have been remarkably improved. By using channeling measurement mode, crystallinity and ratio of substitutional / interstitial atoms can be evaluated. Our new RBS system opens up the possibility of new analytical method in various fields, and gives you new insight for your challenge.

Features of μRBS

  • Accurate composition/density analysis in a microscopic region by using focused ion beam
  • Quantification of all elements by using high mass resolution mode
  • High sensitive detection of light elements (H, Li, B etc.)

Example

Orbitrap Fusion Lumos
Orbitrap Fusion Lumos is a high-performance mass spectrometer which has the world's highest resolution (500,000) and advanced analytical functions such as multi-stage MS and electron transfer dissociation (ETD).
Using the mass spectrometer, it becomes possible to analyze binding sites of O-glycan on bio-pharmaceuticals and of the drug on antibody-drug conjugate.

Technical Data

Introduction Movie

ASTAR-STEM
ACOM-TEM (Automated Crystal Orientation Mapping in TEM) is one of powerful techniques for the crystallographic characterization with nanometer spatial resolution. Crystal orientation and grain size can be evaluated quantitatively. This technique is based on TEM so that conventional observation and EDX/EELS measurements are also available in the same experimental system.

Technical Data

O-PTIR
Optical Photothermal IR Spectroscopy (O-PTIR) enables the infrared measurement with a high spatial resolution of less than 1 μm to be impossible by use of conventional FT-IR. It can be applied to analyse the composition of small foreign substances, and the interface composition of multi-layered samples at the same time and with a spatial resolution of less than 1 μm. By combining Raman instrument, O-PTIR realizes the high quality analysis of inorganic and organic materials.

Technical Data

Topics

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