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- OLED Organic Light Emitting Diode
OLED Organic Light Emitting Diode
- Reverse engineering
- Lighting
- signage
- foldable
- flexible
- QLED
- QD-OLED
- QD
- Quantum dot
We started to develop R&D of OLED since 1995 Analysis experiences including reverse engineering reach to more than 5,000 OLED panels. We provide analytical services which can solve the problems in manufacturing process and improve materials with accumulated knowledge for OLED analysis, such as organic materials, composition, multilayer structure, degradation analysis, water permeability etc.
History of Technology

Customer’s Benefits
Molecular information of OLED multilayers
Accurate material information; elements, organic components in multilayers
Structural observation
High contrast observation of organic multilayers
Reverse Engineering
Optimal proposal and analysis based on cumulative experience
One-stop service for both the purchase and analysis of devices
Cause analysis of degradation
Chemical structure of degradation products after driving test
Water permeability analysis with heavy water
Technical Documents
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Water permeability analysis by D-SIMS
Use of isotope-labeled water, D2O, and D-SIMS enables us to clarify permeated D2O profile after exposure in D2O vapor. This method is promising for evaluating the water permeation behavior both in inorganic films and organic films.
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Determination of multilayer structure of OLED by cross-sectional_TEM
Organic layers with similar composition can be distinguished by TEM with our original contrast enhancement. By cross-sectional TEM-EDX of the defect which was found in surface SEM, we can reveal the detailed structure and the composition of it.
P01963_Determination_of_multilayer_structure_of_OLED_by_cross-sectional_TEM.pdf
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TOF-SIMS MS/MS for analysis of degradation product in OLED driving test
PL line analysis, GCIB-TOF-SIMS, and TOF-SIMS MS/MS were applied to the degradation analysis of OLED in driving test. TOF-SIMS MS/MS revealed the detailed chemical structure of degradation product in the specific depth region in OLED stacks.
P01964_TOF-SIMS_MS_MS_for_analysis_of_degradation_product_in_OLED_driving_test.pdf
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Analytical Techniques Available for OLEDs