List of Publications and Presentation

Under the guiding principle of "Contributing to the society through advanced technologies", we have continuously continued technological development since our foundation. We publish the results of pursuing "ultra cutting edge science and technology", such as the development of new analytical techniques, devising pretreatment techniques, and application and development to various device fields, at academic conferences and papers.

  • Stress Characterization of Crystal Junction of a Mosaic Diamond Substrate (an Approximately 4 cm2) Using Near-Field Optical Raman Microscopy

    Masanobu Yoshikawa, Tatsuhiro Nagasaka, Masataka Murakami, Yoshihiko Nakata, Junichiro Sameshima

    Journal of Raman Spectroscopy

  • A Novel Interface Characterization Technique for Hybrid Bonding Process Optimization

    ●Masahiro Saito, Tomohiro Sakata, Tetsuro Ota, Jumpei Yahiro, Ryu Suzuki

    27th Electronics Packaging Technology Conference (Singapore)

  • Annealing effect for Backside Metallization of SiC device

    ●Junichiro Sameshima, Hideki Sako, Ai Hashimoto

    27th Electronics Packaging Technology Conference (Singapore)

  • Hydrogen-Bonded Structure Analysis of Water Molecules in the Subnanoscale Pores of Reverse Osmosis Membrane

    Jumpei Yahiro, Shinya Mitsui1, Harutoki Shimura1, Koichi Ozaki, Masaru Nakada, Masahiro Kunisu, Naoya Kurahashi2, Hisao Kiuchi2 and Yoshihisa Harada2
    (1:Toray、2:Tokyo Univ.)

    Langmuir 41, 45, 30160–30166 (2025).

  • Deconvolution of CD spectra of the guanine-rich insulin aptamer: IGA3 and elucidation of its specific structure which binds to the insulin

    ●N.Iwano, T.Oyama1,2, M.Tomizawa1,3, K.Ikebukuro1
    (1:Tokyo University of Agriculture and Technology, 2:JASCO, 3:SilCreTech)

    ISNAC 2025 (Toyama)

  • Characterization of impurities in SiC using Secondary Ion Mass Spectrometry

    Akahori Seishi

    APCSCRM2025 (Asia Pacific Conference On Silicon Carbide and Related Materials 2025) (Zhengzhou)

  • Leading-edge Analytical Solutions for 3D-IC Development and Hybrid Bonding Process Optimization

    ●Tomohiro Sakata, Masahiro Saito, Hirofumi Seki, Hideki Hashimoto

    International Microelectronics Assembly and Packaging Society 2025 (San Diego)

  • Effect of silica fillers on the curing reaction of epoxy–imidazole thermoset resin

    ●Tomohiro Sakata, Keiji Naka

    International Microelectronics Assembly and Packaging Society 2025 (San Diego)

  • Machine learning prediction of heat capacity of polymers as a function of temperature

    Kazuhiko Ishikiriyama

    Polymer, 339, 129171 (2025)

  • Proteomic Analysis of Proteins Contained in Exosomesin Cell Culture Supernatant

    ●K. Kawano, A. Sakurai, C. Inada1, M. Sato1, W. Yano1, N Nakamura1 (1:Kamakura Techno-Science)

    The 40th Annual Meeting of the Japanese Society for the Study of Xenobiotics (Kyoto)

  • Applications and prospects of RBS and HFS in Industry

    Junichiro Sameshima

    Annual Meeting of the Japan Society of Vacuum and Surface Science 2025 (Tsukuba)

  • Analytical Solution for Hybrid Bonding Process Optimization

    Masahiro Saito

    International Microsystems, Packaging, Assembly and Circuits Technology conference 2025 (Taipei)

  • Functional and Structural Analyses of Diverse G-Quadruplex and Non-G-Quadruplex Structures Formed by Guanine-Rich Nucleic Acids: A Study on the Insulin Aptamer

    N. Iwano, T. Oyama1,2, M. Tomizawa2, S. Inaba2, R. Mori, Y. Nagasawa2, K. Sode3, K. Tsukakoshi2, T. Nakano, K. Ikebukuro2
    (1:JASCO, 2:Tokyo University of Agriculture and Technology, 3:University of North Carolina at Chapel Hill and North Carolina State University)

    Small, 21, 43 (2025)

  • Classification of scratch-like polishing damage in 4H-SiC wafers using mirror projection electron microscope

    ●Hideki Sako, Shohei Hayashi, Kentaro Ohira1, Daisuke Bizen1, Kenji Kobayashi1, Noriyuki hasuike2, Toshiyuki Isshiki2
    (1:Hitachi High-Tech, 2:Kyoto Institute of Technology)

    ICSCRM2025(Busan, South Korea)

  • Evaluation of the film quality of GDC/YSZ interface in SOFC

    ●Tomohiro Sakata, Maki Urabe, Akihiro Masuda, Katsuyoshi Kakinuma1
    (1:Hydrogen and Fuel Cell Nanomaterials Center, University of Yamanashi)

    World Fuel Cell Conference(Hong Kong)

  • Introduction to the latest analysis for PEMFC and water electrolysis

    Tomohiro Sakata

    World Fuel Cell Conference(Hong Kong)

  • Multiscale Analysis on Intermediate Water Interacting to Polyvinyl Pyrrolidone

    Masaru Nakada

    The 19th Pacific Polymer Conference(Kokura)

  • Structural Analysis of Anion Exchange Membranes for Alkaline Water Electrolysis via Thermal and Chemical Depolymerization Methods

    ●Tsuyoshi Akiyama, Riko Miyoshi, Naru Higeta, Keiko Matsuda

    The 10th Asia-Oceania Mass Spectrometry Conference (AOMSC) 2025 (Okinawa)

  • Study on the Relationship Between Primary Ion Acceleration Voltage and Local Temperature Using SIMS-OES Method

    ●Takashi Miyamoto, Shigenori Numao, Junichiro Sameshima, Masanobu Yoshikawa

    The 24th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-24) (Himeji)

  • The sensitivity of molecular secondary ion of metal element related with oxygen at sample surface in NanoSIMS 50L

    ●Taichi Suda, Ryu Suzuki, Takashi Miyamoto, Junichiro Sameshima

    The 24th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-24) (Himeji)

  • Mass Spectrometry Imaging of Time-Dependently Photodegraded Light Stabilizers in Polyethylene Films Using Tapping-Mode Scanning Probe Electrospray Ionization

    Tsuyoshi Akiyama, Yoichi Otsuka1, Mengze Sun1, Shinichi Yamaguchi2, Michisato Toyoda1
    (1:Osaka University, 2:Shimazu Corporation)

    Mass Spectrometry(Tokyo), 14, A0173 (2025).

  • Free volume evaluation of thermosetting epoxy resins using positron annihilation lifetime spectroscopy

    Hiroyuki Hosomi

    The 20th International Conference on Positron Annihilation (ICPA20) (Takamatsu)

  • Effect of heat treatment on the nanopore structure of the polyethyleneimine films elucidated by the energy-variable positron annihilation lifetime technique

    ●Shigeru Yoshimoto,Kenji Ito1 (1:AIST)

    The 20th International Conference on Positron Annihilation (ICPA20) (Takamatsu)

  • Evaluation of the nanopore structure for polyethyleneimine/silica-gel composites using the positron annihilation lifetime technique

    ●Shigeru Yoshimoto,Kenji Ito1 (1:AIST)

    The 20th International Conference on Positron Annihilation (ICPA20) (Takamatsu)

  • Oxygen-dependent non-isothermal degradation kinetics of polypropylene: a predictive model

    Tomohiro Ohkawa, Yoshitomo Furushima, Benedikt Keitel1 2, Mehmet Dinc1 2, Boris Mizaikoff1 2 (1:Ulm University, 2:Hahn-Schickard)

    Polymer, 331, 128470 (2025).

  • Effect of Silica fillers on the Curing Reaction of Epoxy–Imidazole Thermoset Resin

    ●K. Naka, Y. Furushima, T. Hirano, Y. Taguchi, H. Torigoe1, T. Takao1, A. Takase1, T. Nousou1, Y. Ishikawa1, K. Ishii1
    (1:Sanyu Rec)

    ICEP-IAAC2025 (Nagano)

  • Cryo-transfer energy dispersive X-ray spectroscopic tomography for morphological and elemental analysis of moisture-containing sunscreen creams

    Shin Inamoto, Akiyo Yoshida, Ayaka Yamagishi, Naoto Kaneko, Yuji Otsuka

    Micron, 195, 103824 (2025).

  • Correlating Electrochemical Behavior with Morphological and Compositional Changes in Sulfide Solid Electrolyte All-Solid-State Batteries after Charge/Discharge Cycles

    Yasuhito Aoki, Riko Miyoshi, Kentaro Kato, Sumihisa Ishikawa, Toshikatsu Kojima1, Mitsuharu Tabuchi1
    (1:AIST)

    ACS Appl. Energy Mater., 8(8), 5269–5276 (2025).

  • Effect of Silica Fillers on Epoxy–Imidazole Curing Reaction

    Yoshitomo Furushima, Takayuki Hirano, Keiji Naka, Yoshihiro Taguchi, Tomohiro Ohkawa, Hirohumi Torigoe1, Tomoya Takao1, Atsushi Takase1, Tatsuki Nousou1, Yuki Ishikawa1, Kenji Ishii1
    (1:Sanyu Rec)

    J. Appl. Poly. sci., 142(20), e56895 (2025).

  • Characterization of crystallographic and magnetic domain structure in magnetic alloys by the complementary use of TEM techniques

    ●Takehiro Tamaoka, Yuto Tomita1, Yongmei Jin2, Yasukazu Murakami1(1:Kyushu Univ., 2:Michigan Technological Univ.)

    TMS2025 154th Annual Meeting & Exhibition (Las Vegas, United States)

  • Relationship between Pb ion off-centering and lone pair electrons

    K. Kurushima, H. Nakajima1, T. Ogata2, Y. Sakai2,3, M. Azuma2,3, S. Mori1 (1:Osaka Metropolitan Univ., 2:Institute of Science Tokyo, 3:Kanagawa Institute of Industrial Science and Technology)

    Scientific Reports, 15, 9314, (2025)

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