The 6th Display Webinar

Toray Research Center is an affiliate of Toray Group. We use various equipment to provide customers with analytical services for R&D and industrial support.
We will introduce the latest analytical technologies installed in the past year and show you the most appropriate techniques for different types of displays.

Although the expansion of OLED applications is remarkable, challenges in improving their lifetime and durability remain.
Impurities in organic materials and deposition equipment are considered to be one of the causes of decreasing device lifetime.
Therefore, identifying the impurities is extremely important for quality control of OLED panels.
In this study, we investigate the impurities in an OLED material using mass spectrometry, and we have successfully identified impurities that affect the decrease in device lifetime for OLED materials.

We will present the results of analyzing the factors affecting moisture permeability in SiNx films using various analytical techniques.
Secondary ion mass spectrometry has revealed that the barrier performance of SiNx films drastically decreases as oxidation progresses.
It was confirmed that moisture permeability is very low at depths where oxidation has not yet progressed, indicating that the inherent barrier properties of SiNx films are high.
Furthermore, positron annihilation lifetime spectroscopy suggests that the rate of oxidation progression is related to the pore size of the SiNx films.

TADF (thermal Activated Delayed Fluorescence) materials are energetically researched and developed since they can realize near 100 % internal electroluminescence quantum efficiency without heavy metals.
On the other hand, TADF OLED devices have the problem with device lifetime due to long-time excited state on the TADF process.
In this presentation, we introduce analysis cases of TADF OLED devices degradation by driving test or extrinsic impurities.