| Adsorption isotherm |
|
| Analytical Electron Microscope |
AEM |
| Ar Ion Etching |
AIE |
| Atmospheric Pressure ChemicalIonization |
APCI |
| Atomic Absorption Spectrometry |
AAS |
| Atomic Force Microscope |
AFM |
| Atomic Force Microscope - Infrared Spectrometry / Nano - Infrared Spectrometry |
AFM-IR / Nano-IR |
| Attenuated Total Reflection |
ATR |
| Auger Electron Spectroscopy |
AES |
| Backside SIMS |
|
| Backside XPS |
|
| BET(Brunauer, Emmet and Teller) |
BET |
| Capillary Electrophoresis |
CE |
| Cathodoluminescence |
CL |
| Chemical Ionization |
CI |
| Composition Analysis |
CA |
| Computed Tomography |
CT |
| Confocal Laser Scanning Microscopy |
CLSM |
| Confocal laser scanning microscopy |
LSM |
| Crosssection Polisher / Broad Ion Beam |
CP / BIB |
| Density measurement |
|
| Differential Scanning Calorimetry |
DSC |
| Diffuse Reflectence Infrared Fourier Transform |
DRIFT |
| Diffusion Ordered Spectroscopy |
DOSY |
| Distortion-less Enhancementby Polarization Transfer |
DEPT |
| Double Quantum Filter Correlation Spectroscopy |
DQF-COSY |
| Dynamic viscoelastic measurement |
|
| Electric Force Microscope |
EFM |
| Electron Back Scatter Diffraction patterns |
EBSD |
| Electron Beam Induced Current |
EBIC |
| Electron Energy Loss Spectroscopy |
EELS |
| Electron Ionization |
EI |
| Electron Probe Micro Analysis |
EPMA |
| Electron Spin Resonance |
ESR |
| Electrospray Ionization |
ESI |
| Electrothermal Vaporization-lnductively Coupled Plasma-Mass Spectrometry |
ETV-ICP-MS |
| Elemental Analysis |
EA |
| Energy Dispersive X-ray Fluorescence |
EDX |
| Environmental analysis |
|
| Evolved Gas Analysis |
EGA |
| Extended X-ray Absorption Fine Structure |
EXAFS |
| Fast Atom Bombardment Mass Spectrometry |
FABMS |
| Field Desorption Mass Spectrometry |
FDMS |
| Field Emission-Scanning Electron Microscopy |
FE-SEM |
| Focused Ion Beam |
FIB |
| Focused Ion Beam - Scanning Electron Microscopy |
FIB-SEM |
| Focused Ion Beam - Transmission Electron Microscopy |
FIB-TEM |
| Fourier Transform Infrared Spectroscopy |
FT-IR |
| Gas Chromatogfaphy - Flame Ionization Detector |
GC-FID |
| Gas Chromatography |
GC |
| Gas Chromatography - Flame Photometric Detector |
GC-FPD |
| Gas Chromatography - Thermal Conductivity Detector |
GC-TCD |
| Gas Chromatography / Mass Spectrometry |
GC/MS |
| Gas permeability |
|
| Gel Permeation Chromatography |
GPC |
| Gel Permeation Chromatography - Dynamic Light Scattering |
GPC-DLS |
| Gel Permeation Chromatography - Laser Light Scattering |
GPC-LS |
| Gel Permeation Chromatography - Multi Angle Laser Light Scattering |
GPC-MALS |
| Gel Permeation Chromatography - Viscometry |
GPC-VISCO |
| Glow Discharge Mass Spectrometry |
GD-MS |
| Glow Discharge Optical Emission Spectroscopy |
GD-OES |
| Grazing Incidence X-ray Reflectivity |
GIXR |
| Heteronuclear Multiple Bond Coherence |
HMBC |
| Heteronuclear Multiple Quantum Coherence |
HMQC |
| High Angle Annular Dark Field |
HAADF |
| High Performance Liquid Chromatography |
HPLC |
| High Resolution Analytial Electron Microscope |
HRAEM |
| High Resolution Transmission Electron Microscope |
HRTEM |
| High Resolution-Rutherford Backscattering Spectrometry |
HR-RBS |
| Hydrogen Forward Scattering Spectrometry |
HFS |
| Infrared Spectroscopy |
IR |
| Ion implantation |
|
| Kelvin probe Force Microscope |
KFM |
| Laser Ablation - lnductively Coupled Plasma - Mass Spectrometry |
LA-ICP-MS |
| Liquid Chromatography / MassSpectrometry |
LC/MS |
| Liquid Chromatography / NuclearMagnetic Resonance |
LC/NMR |
| Liquid Chromatography / Tandem Mass Spectrometry |
LC/MS/MS |
| lnductively Coupled Plasma - Atomic Emission Spectrometry |
ICP-AES |
| lnductively Coupled Plasma - Mass Spectrometry |
ICP-MS |
| lon Chromatography |
IC |
| lon Chromatography - Mass Spectrometry |
IC-MS |
| lon Milling |
IM |
| Magnetic Force Microscope |
MFM |
| Mass Spectrometry |
MS |
| Material test |
|
| Matrix Assisted Laser Desorption / Ionization - Time of Flight Mass Spectrometry |
MALDI-TOFMS |
| Matrix Assisted Laser Desorption/Ionization-Mass Spectrometry |
MALDI-MS |
| Micro Focus X-ray Inspection System |
XCT |
| Micro Fourier Transform Infrared Spectroscopy (FTIR) |
micro FT-IR |
| Micro Raman Spectroscopy |
micro Raman |
| Mössbauer spectroscopy / Moessbauer Spectroscopy |
|
| Nano Beam Diffraction |
NBD |
| Nano Indentation |
|
| nano-ThermalAnalysis, micro-ThermalAnalysis |
nano-TA, μ-TA |
| Nuclear Magnetic Resonance |
NMR |
| Nuclear Reaction Analysis |
NRA |
| Optical Microscope |
OM |
| Particle counter, Particle size, Particle size distribution |
|
| ParticleInduced X-ray Emission |
PIXE |
| pH measurement |
pH |
| Photoacoustic Spectroscopy |
PAS |
| Photoluminescence |
PL |
| Plan View TEM |
|
| Polymer Flow Scheme Tests |
|
| Pore Size Distribution |
PSD |
| Positron Annihilation Lifetime Spectroscopy |
PALS |
| Raman Spectroscopy |
Raman |
| Refelection Absorption Spectroscopy |
RAS |
| Reflection Electron Energy Loss Spectroscopy |
REELS |
| Refractive index measurement |
|
| Riedveld Method |
Riedveld Method |
| Rutherford Backscattering Spectrometry |
RBS |
| Scanning Capacitance Microscope |
SCM |
| Scanning Electron Microscope |
SEM |
| Scanning Ion Microscope |
SIM |
| Scanning Probe Microscope |
SPM |
| Scanning Spreading Resistance Microscope |
SSRM |
| Scanning Transmission Electron Microscope |
STEM |
| Secondary Ion Mass Spectrometry |
SIMS |
| Specific surface measurement |
|
| Spherical aberration corrected Scanning Transmission Electron Microscope |
Cs-corrected STEM |
| Spreading Resistance Analysis |
SRA |
| Surface Potential Microscope |
SPoM |
| surface tensiometry, interfacial tensiometry, contact angle measurement |
|
| Temperature Programmed Desorption - Mass Spectrometry |
TPD-MS |
| Thermal Analysis |
TA |
| Thermal conductivity |
|
| Thermal conductivity (3-omega Method) |
|
| Thermal conductivity (Thermoreflectance Method) |
|
| Thermal Desorption Spectroscopy |
TDS |
| Thermal diffusivity ・ Thermal conductivity |
|
| Thermo - mechanical Analysis |
TMA |
| Thermogravimetry |
TG |
| Thermogravimetry - Differential Thermal Analysis |
TG-DTA |
| Thermogravimetry - Mass Spectrometry |
TG-MS |
| Time of Flight - Secondary Ion Mass Spectrometry |
TOF-SIMS |
| Total Organic Carbon |
TOC |
| Total Reflection X-ray Fluorescence |
TXRF |
| Transmission Electron Microscope |
TEM |
| Tunneling atomic force microscope |
TUNA |
| two-dimensional Fast Fourier Transform Analysis |
2-D FFT |
| Ultraviolet-Visible Absorption Spectroscopy |
UV-VIS |
| Vapor pressure measurement |
|
| Wavelength Dispersive X-ray Fluorescence |
WDX |
| Weak-Beam method |
Weak-Beam |
| X-ray Absorption Fine Structure |
XAFS |
| X-ray Absorption Near Edge Structure |
XANES |
| X-ray diffraction |
XRD |
| X-ray Fluorescence |
XRF |
| X-ray Photoelectron Spectroscopy |
XPS |
| X-ray Reflectivity Analysis |
XRR |
| X-ray Scanning Analytical Microscope |
XSAM |
| Zeta potential measurement |
|
