Evaluation of Cu oxides with (S)TEM
Examples of evaluation for oxidation states at nm area with (S)TEM are shown. Chemical states mapping are acquired with composition analysis by EDS (including quantification) and EELS combining with multiple linear least-squares (MLLS) fitting analysis. Crystal structure identification by electron diffraction are also available. TechData_P01144E (PDF:768KB)
Measurement of water diffusion into sealing layer
For evaluation of water sealing layer, we provide water diffusion measurement service using heavy water (D2O) treatment and Secondary Ion Mass Spectrometry (SIMS). This service is applicable to organic sealing layer also. TechData_P01138E (PDF:265KB)
Surface Analysis by TOF-SIMS
TOF-SIMS is one of the most sensitive technique for the surface analysis. It is widely used for the troubleshooting related to the surface or the interface of devices, the component analysis of small areas or thin layers, and so on. TechData_P01252E (PDF:349KB)
For realization of more accurate thermal design
In thermal design, in order to reduce the deviation between the temperature distribution of the device during operation and the results of the heat transfer calculations, the exact model and accurate properties are required. The best way for realizing the optimal thermal design are to apply a suitable technique for measuring the thermophysical property values of used material, furthermore, to be evaluate the heat release characteristics of an actual device. TechData_P01001E (PDF:492KB)