Organics

Elemental Analysis of CHN
Element Concentration of carbon (C), hydrogen (H), and nitrogen (N) in organic materials is able to be analyzed. TechData_S00233E (PDF:264KB)
High resolution LC/FTMS
TechData_P00918E (PDF:456KB)
Karl Fischer moisture measurement system
Karl Fischer Method is the method to measure water content in various materials (ex. industrial products, foods, pharmaceutical products). TechData_S00244E (PDF:244KB)
Organic composition analysis
Composition analysis of various chemical products is possible by applying high level separation techniques and appropriate analytical methods with wealth of experiences. A procedure of organic composition analysis and application results on various industrial materials are introduced. TechData_P01011E (PDF:235KB)
Organic Structural Analysis Using High Resolution GC/MS
High resolution GC/TOF-MS enables us to calculate the elemental compositions of individual compounds. The field ionization (FI) method is also useful in structural analysis, as it yields molecular ions clearly. TechData_P01189E (PDF:325KB)
MALDI-MS -principle and application-
TechData_S00267E (PDF:589KB)
Water content measurement using Karl Fischer method, TPD-MS and GC
To obtain a reliable water content, Karl Fischer (KF) method, Temperature Programmed Desorption - Mass Spectroscopy (TPD-MS) and Gas chromatography (GC) can be applied. It is important to select an appropriate method depending on sample features (e.g. size, composition or state). TechData_P00856E (PDF:318KB)
Nano-Scale Structural Analysis of Layers and Interfaces in OLED devices
Organic layers with similar composition can be distinguished by TEM with our original contrast enhancement. By TEM-EDX with large-aperture detector, we can observe the thin layers and light elements, which are undetectable by conventional TEM-EDX. GCIB-TOF-SIMS enables depth profiling of organic materials and thus is useful for operational degradation analysis of OLED devices. TechData_P00864E (PDF:746KB)
Depth profile analysis of organic materials by GCIB-TOF-SIMS
By depth profile analysis using GCIB, which is low-damage etching ion beam, depth distribution of organic molecules can be obtained with high sensitivity and high accuracy. GCIB-TOF-SIMS analysis is a very effective technique for evaluation of organic samples in terms of multilayer structure, distribution and degradation of organics. TechData_P00905E (PDF:570KB)
microGPC fractionation system
TechData_S00268E (PDF:431KB)
XPS analysis using the GCIB etching
The sample damage during the GCIB (Gas cluster ion beam) etching is very small, so depth profile analyses of organic materials are possible by using the GCIB etching. In addition, the GCIB etching is effective as the method of cleaning organic contamination on the inorganic material surface. TechData_P01179E (PDF:189KB)
Quantitative analysis of trace components in electronic materials with LC/MS/MS
LC/MS/MS is extremely effective for microanalysis of industrial products including electronics devices, because of its high sensitivity and highly selective quantitative capability. The applications to quantitative analysis of the trace components are shown here. TechData_P00178E (PDF:402KB)