List of Papers
Under the guiding principle of "Contributing to the society through advanced technologies", we have continuously continued technological development since our foundation. We publish the results of pursuing "ultra cutting edge science and technology", such as the development of new analytical techniques, devising pretreatment techniques, and application and development to various device fields, at academic conferences and papers.
  • "Structural and Dynamical Characterisation of Intermediate Water Interacting Polyvinyl Pyrrolidone"
    Masaru Nakada*, Hiroyuki Ishida, Yoshitomo Furushima
    Materialia 12 (2020) 100743.
  • "Crystallization and melting of poly(butylene terephthalate) and poly(ethylene terephthalate) investigated by fast-scan chip calorimetry and small angle X-ray scattering"
    Akihiko Toda*, Ken Taguchi, Koji Nozaki, Xinchao Guan, Wenbing Hu, Yoshitomo Furushima, Christoph Schick
    Polymer 192 (2020) 122303, 1-10.
  • "Isothermal crystallization kinetics, morphology, and crystalline structure of polypropylene/poly(4‐methyl‐1‐pentene) blends"
    Yoshitomo Furushima, Masaru Nakada, Akihiro Masuda, Kazuma Okada1, Naoko Iwata1, Masatoshi Ohkura1 (1:Toray Industries)
    Polymer Crystallization 3, DOI: 10.1002/pcr2.10102 (2020).
  • "Relationship between depth of basal-plane dislocations and expanded stacking faults by application of forward current to 4H-SiC p-i-n diodes"
    S. Hayashi, T. Yamashita1, J. Senzaki1, T. Kato1, Y. Yonezawa1, K. Kojima1, and H. Okumura1 (1:AIST)
    Applied Physics Express 12, 051007 (2019).
  • "Stress Characterization of Interface between Thermal Oxide and 4H-SiC Epitaxial Layer using Near-field Optical Raman Microscopy"
    Masanobu Yoshikawa, Yasuhiko Fujita, and Masataka Murakami
    Applied Spectroscopy, 73(10), 1193 (2019).
  • "Luminescence from AlGaN/GaN HEMT structures by very-low-energy (100 eV) electron beams using beam deceleration technique"
    Ryuichi Sugie, Tomoyuuuki Uchida, Takashi Fujii1, and Tsutomu Araki1 (1:Ritsumeikan University)
    Japanese Journal of Applied Physics 58, 010902 (2019).
  • "Microscopic magnetization distribution of Bloch lines in a uniaxial magnet"
    K. Kurushima, K. Tanaka1, H. Nakajima2, M. Mochizuki1 and S. Mori2 (1:Waseda University, 2:Osaka Prefecture University)
    Journal of Applied Physics 125, 053902 (2019).
  • "The effect of poly(4‐methyl‐1‐pentene) on the nonisothermal crystallization kinetics of polypropylene"
    Yoshitomo Furushima, Akihiro Masuda, Taiki Kuroda, Kazuma Okada1, Naoko Iwata1, Masatoshi Ohkura1, Masayuki Yamaguchi2 (1:Toray Industries, 2:Japan Advanced Institute of Science and Technology)
    Polymer Crystallization 2, DOI: 10.1002/pcr2.10082 (2019).
  • "Determining the quasi-real-time change in the glass transition temperature of a thermoset resin under cure using fast scanning calorimetry"
    Yoshitomo Furushima
    Thermochimica Acta 677, 79 (2019).
  • "Quantification of Trace Arsenic in Whole Blood by ICP-QMS/QMS"
    J. Shirataki, K. Fujisaki, K. Sakaguchi and N. Sato
    Analytical Sciences, 34, 735 (2018).
  • "Infrared spectroscopy and Raman spectroscopy of semiconductor"
    Masanobu Yoshikawa
    Encyclopedia of Analytical Chemistry (John Wiley & Sons Ltd), 2018
  • "Subnanopore Structural Change of Time-elapsed Silica PECVD Films Elucidated by Slow Positron Annihilation and Ellipsometric Porosimetry"
    Shigeru Yoshimoto1,2, Kenji Ito1, Hiroyuki Hosomi, Masaaki Takeda, Toshinori Tsuru2 (1:AIST, 2:Hiroshima University)
    JJAP Conference Proceedings 7, 011205 (2018).
  • "Crystallization/Melting Kinetics and Morphological Analysis of Polyphenylene Sulfide"
    Yoshitomo Furushima, Masaru Nakada, Yuki Yoshida, and Kazuyuki Okada
    Macromolecular Chemistry and Physics 219, 1700481 (2018).
  • "Characterization of Inhomogeneity in SiO2 Films on 4H-SiC Epitaxial Substrate By a Combination of Fourier Transform Infrared and Cathodoluminescence Spectroscopy"
    M. Yoshikawa, K. Inoue, J. Sameshima, and H. Seki
    Materials Science Forum 924, 273 (2018). 
  • "Characterization of Inhomogeneity in Thermal Oxide SiO2 Films on 4H-SiC Epitaxial Substrates by a Combination of Fourier Transform Infrared Spectroscopy and Cathodoluminescence Spectroscopy"
    Masanobu Yoshikawa, Keiko Inoue, Junichiro Sameshima, and Hirohumi Seki
    Materials Science Forum, 924, 273 (2018).
  • "Crystallization, recrystallization, and melting of polymer crystals on heating and cooling examined with fast scanning calorimetry"
    Yoshitomo Furushima*, Akihiko Toda, Christoph Schick
    Polymer Crystallization 1 (2018) e10005, 1-10.
  • "An effect of residual gas component on detected secondary ions during TOF-SIMS depth profiling and a method to estimate contained component"
    J. Sameshima, and M. Yoshikawa
    SURFACE AND INTERFACE ANALYSIS, 50, 8, 802 (2018).
  • "Characterization of Thermal Oxides on 4H-SiC Epitaxial Substrates Using Fourier-Transform Infrared Spectroscopy"
    Hirofumi Seki, Masanobu Yoshikawa, Takuma Kobayashi1,Tsunenobu Kimoto1, and Yukihiro Ozaki2 (1:Kyoto University, 2:Kansei Gakuin University)
    Applied Spectroscopy 71, 911 (2017).
  • "Comment on “Re-exploring the double-melting behavior of semirigid-chain polymers with an in-situ combination of synchrotron nanofocus X-ray scattering and nanocalorimetry” by Ivanov et al. [European Polymer Journal 81 (2016) 598–606.]"
    Yoshitomo Furushima, Bin Yang1, Akihiko Toda2, Christoph Schick1 (1:University of Rostock, 2:Hiroshima University)
    European Polymer Journal 94, 511 (2017).
  • "Effect of heat treatment on the nanoporosity of silica PECVD films elucidated by low-energy positron annihilation and ellipsometric porosimetry"
    Shigeru Yoshimoto1,2,3, Kazuhiro Kumagai2, Hiroyuki Hosomi1, Masaaki Takeda1, Toshinori Tsuru3, Kenji Ito2 (1 Toray Research Center, Inc., 2 AIST, 3 Hiroshima University)
    Journal of Applied Physics 122, 185304 (2017).
  • "Determination of stress components in 4H-SiC power devices via Raman spectroscopy"
    Ryuichi Sugie and Tomoyuki Uchida
    Journal of Applied Physics 122, 195703 (2017).
  • "Crystallization kinetics of poly(butylene terephthalate) and its talc composites"
    Yoshitomo Furushima*, Sadanori Kumazawa, Hideyuki Umetsu, Akihiko Toda, Evgeny Zhuravlev, Andreas Wurm, Christoph Schick
    Journal of Applied Polymer Science 134 (2017) 44739.
  • "Melting and recrystallization kinetics of poly(butylene terephthalate)"
    Yoshitomo Furushima, Sadanori Kumazawa1, Hideyuki Umetsu1, Akihiko Toda2, Evgeny Zhuravlev3, Christoph Schick3 (1:Toray Industries, Inc., 2:Hiroshima University, 3:University of Rostock)
    Polymer 109, 307 (2017).
  • "Chemical structural changes of 70Li2S-30P2S5 solid electrolyte during heat treatment"
    Yasuhito Aoki, Kengo Ogawa, Takeshi Nakagawa, Yuichi Hasegawa, Yoko Sakiyama, Toshikatsu Kojima1, Mitsuharu Tabuchi1 (1:AIST)
    Solid State Ionics 310, 50 (2017).
  • "Stress Characterization of 4H-SiC Metal–Oxide–Semiconductor Field-Effect Transistor (MOSFET) using Raman Spectroscopy and the Finite Element Method"
    Masanobu Yoshikawa, Kenichi Kosaka, Hirohumi Seki, and Tsunenobu Kimoto
    Applied Spectroscopy, 70(7), 1209 (2016).
  • "Characterization of process-induced defects in SiC MOSFETs by cross-sectional cathodoluminescence"
    R. Sugie, T. Uchida, K. Kosaka, and K. Matsumura
    Japanese Journal of Applied Physics 55, 04ER03 (2016).
  • "Two Crystal Populations with Different Melting/Reorganization Kinetics of Isothermally Crystallized Polyamide 6"
    Yoshitomo Furushima, Masaru Nakada, Kazuhiko Ishikiriyama, Akihiko Toda1, Rene Androsch2, Evgeny Zhuravlev3, Christoph Schick3 (1:Hiroshima University, 2:Martin Luther University, 3:University of Rostock)
    Journal of Polymer Science Part B: Polymer Physics 54, 2126 (2016).
  • "Quantitative understanding of two distinct melting kinetics of an isothermally crystallized polymer"
    Yoshitomo Furushima , Akihiko Toda1,Vincent Rousseaux2, Christian Bailly2, Evgeny Zhuravlev3, Christoph Schick3 (1:Hiroshima University, 2:Universite Catholique de Louvain, 3:University of Rostock)
    Polymer 99, 97 (2016).
  • "Insights into thermal diffusion of germanium and oxygen atoms in HfO2/GeO2/Ge gate stacks and their suppressed reaction with atomically thin AlOx interlayers"
    Shingo Ogawa, Ryohei Asahara1, Yuya Minoura1, Hideki Sako, Naohiko Kawasaki, Ichiko Yamada, Takashi Miyamoto, Takuji Hosoi1, Takayoshi Shimura1, and Heiji Watanabe1 (1:Osaka University)
    Journal of Applied Physics 118, 235704 (2015).
  • "Method for Calculation of the Lamellar Thickness Distribution of Not-Reorganized Linear Polyethylene Using Fast Scanning Calorimetry in Heating"
    Yoshitomo Furushima, Masaru Nakada, Masataka Murakami, Tsuneyuki Yamane, Akihiko Toda1, and Christoph Schick2 (1:Hiroshima University, 2:University of Rostock)
    Macromolecules 48, 8831 (2015).
  • "Abnormal Raman Spectral Variation with Excitation Wavelength in Boron-Doped Single-Crystalline Diamond"
    M. Yoshikawa
    Materials Science Forum, 858, 1158 (2015).
  • "Characterization of Inhomogeneity in Silicon Dioxide Films on 4H-Silicon Carbide Epitaxial Substrate Using a Combination of Fourier Transform Infrared and Cathodoluminescence Spectroscopy"
    M. Yoshikawa, H. Seki, K. Inoue, Y. Nanen, T. Kimoto
    Applied Spectroscopy, 68(10), 1176 (2014).
  • "Characterization of silicon dioxide films on 4H-SiC (0001) Si, (1-100)M, and (11-20) A faces by cathodoluminescence spectroscopy"
    M. Yoshikawa, K. Inoue, H. Seki, Y. Nanen, M. Kato, and T. Kimoto
    Applied Physics Letters, 102, 051612 (2013).
  • "Abnormal Behavior of LO phonon in Silicon Dioxide Films on 4H-SiC Bulk Epitaxial Substrate by Fourier Transform Infrared (FT-IR) Spectroscopy"
    M.Yoshikawa, H. Seki, T. Yamane, Y. Nanen, M. Kato, T. Kimoto
    Applied Spectroscopy, 67(5), 542 (2013).
  • "Characterization of Silicon Dioxide Films on 4H-SiC Si (0001) Face by Cathodoluminescence Spectroscopy and X-ray Photoelectron Spectroscopy"
    M. Yoshikawa, S. Ogawa, K. Inoue, H. Seki, Y. Tanahashi, H. Sako, K.Matsuda, Y. Nanen, M. Kato, and T. Kimoto
    Applied Physics Letters, 100, 082105 (2012).
  • "Characterization of Silicon Dioxide Films on 4H-SiC Si(0001) Face by Fourier Transform Infrared Spectroscopy and Cathodoluminescence Spectroscopy"
    M. Yoshikawa, H. Seki, K. Inoue, Y. Tanahashi, H. Sako, Y. Nanen, M. Kato, and T. Kimoto
    Applied Spectroscopy, 65(5), 543 (2011)