Scanning Probe Microscopy : SPM


SPM is a general term for microscopy that a probe would be scanned 2-dimensionally in high spatial resolution being interacted with sample surface. Atomic force microscopy (AFM) is the representative of SPM. AFM is applicable for various materials, for example, polymers, semiconductors and biomaterials. AFM observation is available under atmospheric condition, in vacuum and in aqueous solution.
AFM(SPM) enables us to observe phase separation or to evaluate mechanical properties such as Young’s modulus, adhesion and energy dissipation for polymers. For observation of electrical properties, SCM (available for dopant profile) or KFM (suited for surface potential on semiconductors) are well known. Additionally, force curve method would be encouraged to use for confirmation of swollen layer with in fluid for biomaterials.