Adsorption isotherm |
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Analytical Electron Microscope |
AEM |
Ar Ion Etching |
AIE |
Atmospheric Pressure ChemicalIonization |
APCI |
Atomic Absorption Spectrometry |
AAS |
Atomic Force Microscope |
AFM |
Atomic Force Microscope - Infrared Spectrometry / Nano - Infrared Spectrometry |
AFM-IR / Nano-IR |
Attenuated Total Reflection |
ATR |
Auger Electron Spectroscopy |
AES |
Backside SIMS |
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Backside XPS |
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BET(Brunauer, Emmet and Teller) |
BET |
Capillary Electrophoresis |
CE |
Cathodoluminescence |
CL |
Chemical Ionization |
CI |
Composition Analysis |
CA |
Computed Tomography |
CT |
Confocal Laser Scanning Microscopy |
CLSM |
Confocal laser scanning microscopy |
LSM |
Crosssection Polisher / Broad Ion Beam |
CP / BIB |
Density measurement |
|
Differential Scanning Calorimetry |
DSC |
Diffuse Reflectence Infrared Fourier Transform |
DRIFT |
Diffusion Ordered Spectroscopy |
DOSY |
Distortion-less Enhancementby Polarization Transfer |
DEPT |
Double Quantum Filter Correlation Spectroscopy |
DQF-COSY |
Dynamic viscoelastic measurement |
|
Electric Force Microscope |
EFM |
Electron Back Scatter Diffraction patterns |
EBSD |
Electron Beam Induced Current |
EBIC |
Electron Energy Loss Spectroscopy |
EELS |
Electron Ionization |
EI |
Electron Probe Micro Analysis |
EPMA |
Electron Spin Resonance |
ESR |
Electrospray Ionization |
ESI |
Electrothermal Vaporization-lnductively Coupled Plasma-Mass Spectrometry |
ETV-ICP-MS |
Elemental Analysis |
EA |
Enzyme-Linked Immunosorbent Assay |
ELISA |
Energy Dispersive X-ray Fluorescence |
EDX |
Environmental analysis |
|
Evolved Gas Analysis |
EGA |
Extended X-ray Absorption Fine Structure |
EXAFS |
Fast Atom Bombardment Mass Spectrometry |
FABMS |
Field Desorption Mass Spectrometry |
FDMS |
Field Emission-Scanning Electron Microscopy |
FE-SEM |
Focused Ion Beam |
FIB |
Focused Ion Beam - Scanning Electron Microscopy |
FIB-SEM |
Focused Ion Beam - Transmission Electron Microscopy |
FIB-TEM |
Fourier Transform Infrared Spectroscopy |
FT-IR |
Gas Chromatogfaphy - Flame Ionization Detector |
GC-FID |
Gas Chromatography |
GC |
Gas Chromatography - Flame Photometric Detector |
GC-FPD |
Gas Chromatography - Thermal Conductivity Detector |
GC-TCD |
Gas Chromatography / Mass Spectrometry |
GC/MS |
Gas permeability |
|
Gel Permeation Chromatography |
GPC |
Gel Permeation Chromatography - Dynamic Light Scattering |
GPC-DLS |
Gel Permeation Chromatography - Laser Light Scattering |
GPC-LS |
Gel Permeation Chromatography - Multi Angle Laser Light Scattering |
GPC-MALS |
Gel Permeation Chromatography - Viscometry |
GPC-VISCO |
Glow Discharge Mass Spectrometry |
GDMS |
Glow Discharge Optical Emission Spectroscopy |
GD-OES |
Grazing Incidence X-ray Reflectivity |
GIXR |
Heteronuclear Multiple Bond Coherence |
HMBC |
Heteronuclear Multiple Quantum Coherence |
HMQC |
Hg Probe |
Hg Probe |
High Angle Annular Dark Field |
HAADF |
High Performance Liquid Chromatography |
HPLC |
High Resolution Analytial Electron Microscope |
HRAEM |
High Resolution Transmission Electron Microscope |
HRTEM |
High Resolution-Rutherford Backscattering Spectrometry |
HR-RBS |
Hydrogen Forward Scattering Spectrometry |
HFS |
Infrared Spectroscopy |
IR |
Ion implantation |
|
Isothermal Titration Calorimetry |
ITC |
Kelvin probe Force Microscope |
KFM |
Laser Ablation - lnductively Coupled Plasma - Mass Spectrometry |
LA-ICP-MS |
Liquid Chromatography / MassSpectrometry |
LC/MS |
Liquid Chromatography / NuclearMagnetic Resonance |
LC/NMR |
Liquid Chromatography / Tandem Mass Spectrometry |
LC/MS/MS |
Inductively Coupled Plasma - Optical Emission Spectrometry |
ICP-OES |
lnductively Coupled Plasma - Mass Spectrometry |
ICP-MS |
lon Chromatography |
IC |
lon Chromatography - Mass Spectrometry |
IC-MS |
lon Milling |
IM |
Magnetic Force Microscope |
MFM |
Mass Spectrometry |
MS |
Material test |
|
Matrix Assisted Laser Desorption / Ionization - Time of Flight Mass Spectrometry |
MALDI-TOFMS |
Matrix Assisted Laser Desorption/Ionization-Mass Spectrometry |
MALDI-MS |
Mechanical Properties |
|
Micro Focus X-ray Inspection System |
XCT |
Micro Fourier Transform Infrared Spectroscopy (FTIR) |
micro FT-IR |
Micro Raman Spectroscopy |
micro Raman |
Mössbauer spectroscopy / Moessbauer Spectroscopy |
|
Nano Beam Diffraction |
NBD |
Nano Indentation |
|
NanoSIMS (SIMS:Secondary Ion Mass Spectrometry) |
NanoSIMS |
nano-ThermalAnalysis, micro-ThermalAnalysis |
nano-TA, μ-TA |
Nuclear Magnetic Resonance |
NMR |
Nuclear Magnetic Resonance |
NMR-S |
Nuclear Reaction Analysis |
NRA |
Optical Microscope |
OM |
Particle counter, Particle size, Particle size distribution |
|
ParticleInduced X-ray Emission |
PIXE |
pH measurement |
pH |
Photoacoustic Spectroscopy |
PAS |
Photoluminescence |
PL |
Plan View TEM |
|
Polymer Flow Scheme Tests |
|
Pore Size Distribution |
PSD |
Positron Annihilation Lifetime Spectroscopy |
PALS |
Raman Spectroscopy |
Raman |
Refelection Absorption Spectroscopy |
RAS |
Reflection Electron Energy Loss Spectroscopy |
REELS |
Refractive index measurement |
|
Rheological Properties |
|
Riedveld Method |
Riedveld Method |
Rutherford Backscattering Spectrometry |
RBS |
Scanning Capacitance Microscope |
SCM |
Scanning Electron Microscope |
SEM |
Scanning Ion Microscope |
SIM |
Scanning Probe Microscope |
SPM |
Scanning Spreading Resistance Microscope |
SSRM |
Scanning Transmission Electron Microscope |
STEM |
Secondary Ion Mass Spectrometry |
SIMS |
Specific surface measurement |
|
Spherical aberration corrected Scanning Transmission Electron Microscope |
Cs-corrected STEM |
Spreading Resistance Analysis |
SRA |
Surface Potential Microscope |
SPoM |
Saturation Transfer Difference -Nuclear Magnetic Resonance |
STD-NMR |
surface tensiometry, interfacial tensiometry, contact angle measurement |
|
Temperature Programmed Desorption - Mass Spectrometry |
TPD-MS |
Thermal Analysis |
TA |
Thermal conductivity |
|
Thermal conductivity (3-omega Method) |
|
Thermal conductivity (Thermoreflectance Method) |
|
Thermal Desorption Spectroscopy |
TDS |
Thermal diffusivity ・ Thermal conductivity |
|
Thermo - mechanical Analysis |
TMA |
Thermogravimetry |
TG |
Thermogravimetry - Differential Thermal Analysis |
TG-DTA |
Thermogravimetry - Mass Spectrometry |
TG-MS |
Time of Flight - Secondary Ion Mass Spectrometry |
TOF-SIMS |
Total Organic Carbon |
TOC |
Total Reflection X-ray Fluorescence |
TXRF |
Transmission Electron Microscope |
TEM |
Tunneling atomic force microscope |
TUNA |
two-dimensional Fast Fourier Transform Analysis |
2-D FFT |
Ultraviolet Photoelectron Spectroscopy |
UPS |
Ultraviolet-Visible Absorption Spectroscopy |
UV-VIS |
Vapor pressure measurement |
|
Wavelength Dispersive X-ray Fluorescence |
WDX |
Weak-Beam method |
Weak-Beam |
X-ray Absorption Fine Structure |
XAFS |
X-ray Absorption Near Edge Structure |
XANES |
X-ray diffraction |
XRD |
X-ray Fluorescence |
XRF |
X-Ray Microscope |
XRM |
X-ray Photoelectron Spectroscopy |
XPS |
X-ray Reflectivity Analysis |
XRR |
X-ray Scanning Analytical Microscope |
XSAM |
Zeta potential measurement |
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