Analysis of oxygen vacancies near the tin atoms in ITO film
TechData_P00053E (PDF:349KB)
Analytical Techniques Available for OLEDs
TechData_P00170E (PDF:432KB)
Characterizations of poly-silicon for Active Matrix Displays
TechData_P00070E (PDF:343KB)
Degradation Mechanism Analysis of OLED - Applicable to structural changes in dark spots of micrometer size -
TechData_P00027E (PDF:152KB)
Depth Profile Analysis of OLED Devices
TechData_P00089E (PDF:342KB)
Enclosed Gas Analysis of Display Panel
TechData_P00535E (PDF:394KB)
Principle of ellipsometry
TechData_S00230E (PDF:180KB)
Structure Analysis of OLED Devices
TechData_P00028E (PDF:327KB)
TEM Observation and Depth Profiling of OLED
TechData_P00169E (PDF:280KB)
Trace Analysis of the Organic Materials in OLED Device
TechData_P00029E (PDF:208KB)
Comprehensive characterization of OLED
TechData_P00914E (PDF:298KB)
Degradation analysis of OLED -Influence of trace level water in accelerated test-
TechData_P01178E (PDF:206KB)
Electronic states of a-In-Zn-O films analyzed by x-ray photoelectron and reflected electron energy loss spectroscopies
TechData_P00846E (PDF:180KB)
High sensitivity depth profiling of light elements in Si semi-conductor by specialized TOF-SIMS
TechData_P01242E (PDF:383KB)
Sealing capability measurement using isotope marker
TechData_P01094E (PDF:327KB)
Surface Analysis by TOF-SIMS
TechData_P01252E (PDF:349KB)
u-RBS/HFS Composition and Density Analysis in Micro Region
TechData_P00984E (PDF:387KB)
u-RBS/HFS Compositional Analysis in Small Areas
TechData_T00116E (PDF:240KB)
Nano-Scale Structural Analysis of Layers and Interfaces in OLED devices
TechData_P00864E (PDF:746KB)
Depth profile analysis of organic materials by GCIB-TOF-SIMS
TechData_P00905E (PDF:570KB)