Our Techniques

Analysis Techniques / Specimen Prep. abbr.
Adsorption isotherm  
Analytical Electron Microscope AEM
Ar Ion Etching AIE
Atmospheric Pressure ChemicalIonization APCI
Atomic Absorption Spectrometry AAS
Atomic Force Microscope AFM
Atomic Force Microscope - Infrared Spectrometry / Nano - Infrared Spectrometry AFM-IR / Nano-IR
Attenuated Total Reflection ATR
Auger Electron Spectroscopy AES
Backside SIMS  
Backside XPS  
BET(Brunauer,Emmet and Teller) BET
Capillary Electrophoresis CE
Cathodoluminescence CL
Chemical Ionization CI
Composition Analysis CA
Computed Tomography CT
Confocal Laser Scanning Microscopy CLSM
Confocal laser scanning microscopy LSM
Crosssection Polisher / Broad Ion Beam CP / BIB
Density measurement  
Differential Scanning Calorimetry DSC
Diffuse Reflectence Infrared Fourier Transform DRIFT
Diffusion Ordered Spectroscopy DOSY
Distortion-less Enhancementby Polarization Transfer DEPT
Double Quantum Filter Correlation Spectroscopy DQF-COSY
Dynamic viscoelastic measurement  
Electric Force Microscope EFM
Electron Back Scatter Diffraction patterns EBSD
Electron Beam Induced Current EBIC
Electron Energy Loss Spectroscopy EELS
Electron Ionization EI
Electron Probe Micro Analysis EPMA
Electron Spin Resonance ESR
Electrospray Ionization ESI
Electrothermal Vaporization-lnductively Coupled Plasma-Mass Spectrometry ETV-ICP-MS
Elemental Analysis EA
Energy Dispersive X-ray Fluorescence EDX
Environmental analysis  
Evolved Gas Analysis EGA
Extended X-ray Absorption Fine Structure EXAFS
Fast Atom Bombardment Mass Spectrometry FABMS
Field Desorption Mass Spectrometry FDMS
Field Emission-Scanning Electron Microscopy FE-SEM
Focused Ion Beam FIB
Focused Ion Beam - Scanning Electron Microscopy FIB-SEM
Focused Ion Beam - Transmission Electron Microscopy FIB-TEM
Fourier Transform Infrared Spectroscopy FT-IR
Gas Chromatogfaphy - Flame Ionization Detector GC-FID
Gas Chromatography GC
Gas Chromatography - Flame Photometric Detector GC-FPD
Gas Chromatography - Thermal Conductivity Detector GC-TCD
Gas Chromatography / Mass Spectrometry GC/MS
Gas permeability  
Gel Permeation Chromatography GPC
Gel Permeation Chromatography - Dynamic Light Scattering GPC-DLS
Gel Permeation Chromatography - Laser Light Scattering GPC-LS
Gel Permeation Chromatography - Multi Angle Laser Light Scattering GPC-MALS
Gel Permeation Chromatography - Viscometry GPC-VISCO
Glow Discharge Mass Spectrometry GDMS
Grazing Incidence X-ray Reflectivity GIXR
Heteronuclear Multiple Bond Coherence HMBC
Heteronuclear Multiple Quantum Coherence HMQC
High Angle Annular Dark Field HAADF
High Performance Liquid Chromatography HPLC
High Resolution Analytial Electron Microscope HRAEM
High Resolution Transmission Electron Microscope HRTEM
High Resolution-Rutherford Backscattering Spectrometry HR-RBS
Hydrogen Forward Scattering Spectrometry HFS
Infrared Spectroscopy IR
Ion implantation  
Kelvin probe Force Microscope KFM
Laser Ablation - lnductively Coupled Plasma - Mass Spectrometry LA-ICP-MS
Liquid Chromatography / MassSpectrometry LC/MS
Liquid Chromatography / NuclearMagnetic Resonance LC/NMR
Liquid Chromatography / Tandem Mass Spectrometry LC/MS/MS
lnductively Coupled Plasma - Atomic Emission Spectrometry ICP-AES
lnductively Coupled Plasma - Mass Spectrometry ICP-MS
lon Chromatography IC
lon Chromatography - Mass Spectrometry IC-MS
lon Milling IM
lon Selective Electrode ISE
Magnetic Force Microscope MFM
Mass Spectrometry MS
Material test  
Matrix Assisted Laser Desorption / Ionization - Time of Flight Mass Spectrometry MALDI-TOFMS
Matrix Assisted Laser Desorption/Ionization-Mass Spectrometry MALDI-MS
Micro Focus X-ray Inspection System XCT
Micro Fourier Transform Infrared Spectroscopy (FTIR) micro FT-IR
Micro Raman Spectroscopy micro Raman
Mössbauer spectroscopy / Moessbauer Spectroscopy  
Nano Beam Diffraction NBD
Nano Indentation  
nano-ThermalAnalysis、micro-ThermalAnalysis nano-TA、μ-TA
Nuclear Magnetic Resonance NMR
Nuclear Reaction Analysis NRA
Optical Microscope OM
Particle counter,Particle size,Particle size distribution  
ParticleInduced X-ray Emission PIXE
pH measurement pH
Photoacoustic Spectroscopy PAS
Photoluminescence PL
Plan View TEM  
Polymer Flow Scheme Tests  
Pore Size Distribution PSD
Positron Annihilation Lifetime Spectroscopy PALS
Raman Spectroscopy Raman
Refelection Absorption Spectroscopy RAS
Reflection Electron Energy Loss Spectroscopy REELS
Refractive index measurement  
Riedveld Method Riedveld Method
Rutherford Backscattering Spectrometry RBS
Scanning Capacitance Microscope SCM
Scanning Electron Microscope SEM
Scanning Ion Microscope SIM
Scanning Probe Microscope SPM
Scanning Spreading Resistance Microscope SSRM
Scanning Transmission Electron Microscope STEM
Secondary Ion Mass Spectrometry SIMS
Specific surface measurement  
Spherical aberration corrected Scanning Transmission Electron Microscope Cs-corrected STEM
Spreading Resistance Analysis SRA
Surface Potential Microscope SPoM
surface tensiometry,interfacial tensiometry,contact angle measurement  
Temperature Programmed Desorption - Mass Spectrometry TPD-MS
Thermal Analysis TA
Thermal conductivity  
Thermal conductivity (3-omega Method)  
Thermal conductivity (Thermoreflectance Method)  
Thermal Desorption Spectroscopy TDS
Thermal diffusivity ・ Thermal conductivity  
Thermo - mechanical Analysis TMA
Thermogravimetry TG
Thermogravimetry - Differential Thermal Analysis TG-DTA
Thermogravimetry - Mass Spectrometry TG-MS
Time of Flight - Secondary Ion Mass Spectrometry TOF-SIMS
Total Organic Carbon TOC
Total Reflection X-ray Fluorescence TXRF
Transmission Electron Microscope TEM
Tunneling atomic force microscope TUNA
two-dimensional Fast Fourier Transform Analysis 2-D FFT
Ultraviolet Photoelectron Spectroscopy UPS
Ultraviolet-Visible Absorption Spectroscopy UV-VIS
Vapor pressure measurement  
Wavelength Dispersive X-ray Fluorescence WDX
Weak-Beam method Weak-Beam
X-ray Absorption Fine Structure XAFS
X-ray Absorption Near Edge Structure XANES
X-ray diffraction XRD
X-ray Fluorescence XRF
X-ray Photoelectron Spectroscopy XPS
X-ray Reflectivity Analysis XRR
X-ray Scanning Analytical Microscope XSAM
Zeta potential measurement