fs LA-ICP-MS

fs LA-ICP-MS

We introduced the latest femtosecond laser ablation (fsLA) device equipped with galvanometric optics which enables quick multiple irradiations.
By connecting fsLA to ICP-MS, quantitative analysis of the trace elements in solid sample is available without dissolving sample.
It can also be applied to hard-to-digest materials such as silicon carbide.
In addition, the signal stability and sensitivity of elemental imaging can be significantly improved compared to conventional LA-ICP-MS.